영어에서 Test solution 을 사용하는 예와 한국어로 번역
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Integrated one box test solution with 8-slot PXI chassis and 11 slot modular switch and load unit.
After evaluating the available technologies, we selected LabVIEW software and PXI-based real-time and field-programmable gate array(FPGA) hardware to develop our new test solution.
The D3 architecture is a highly adaptive, modular, multipurpose test solution that incorporates well-developed technology from industry with minimal new design.
The Keysight N4917BACA optical receiver test solution is a complete, automated and repeatable solution for optical receiver stress test. .
Using the Vector test solution for smart charging, you can test on-board charging ECUs without having to operate a real charge spot.
Keysight́s Digital Test Console PCI Express protocol test solution supports all speeds of PCIe,
It can be combined with the M9381A Vector Signal Generator for a fast, compact RF component test solution.
EV1003A Power Converter Test Solution- designed specifically to address the efficiency,
Introducing Ixia's AresONE 8-port 400GE test solution- all in an industry's-smallest, 2 rack-unit fixed chassis.
In addition to our standard DPD tool, LitePoint has partnered with NanoSemi to provide a new Adaptive DPD for zSeries PA/FEM test solution.
IQxel-MW™ is a comprehensive, multi-device test solution for the next generation of wireless connectivity devices, ideal for both R&D and high-volume production. Options include.
The E6950A eCall/ERA-GLONASS Conformance Test Solution simulates a PSAP and controls an UXM/8960 and MXG to emulate a cellular network.
LEENO can provide a System Level Test solution on various types of packages.
We felt confident in deploying a PXI-based production test solution based on NI technology for our MEMS devices.
The CMW500 is the first C-V2X test solution approved by the Global Certification Forum(GCF).
The Rohde& Schwarz Bluetooth RF test solution with the R&S®CMW and R&S®CMWrun is closely aligned to the Bluetooth RF Test Suite.
The LitePoint® zSeries RFIC is a comprehensive Design Test Solution optimized for bring-up and design verification of RFIC chipsets used in mobile devices.
LitePoint IQfact+ is a turnkey, chipset-specific wireless test solution, enabling rapid volume manufacturing with a minimum of engineering effort.
LitePoint solutions cover all Samsung Semiconductor wireless chipsets; no matter which Samsung Semiconductor product you are using, LitePoint designs a test solution that will meet your needs.
LitePoint to Showcase Test Solution for Broadcom 802.11ax Wi-Fi Chips at Mobile World Congress 2018.